二手安捷伦仪器回收，信号发生器回收

二手安捷伦仪器回收，信号发生器回收


深圳市鸿瑞科电子仪器有限公司（苏州分公司）

联系人：罗志兵：

手机号/号：

Q

e-mail：hrklzb@

公司网址：

地 址：苏州市 昆山市 玉山镇 衡山路 四季华城


回收二手仪器-二手仪器回收商-上门回收仪器

回收仪器仪表，整厂回收仪器，回收二手仪器，

回收是德仪器，回收安捷伦仪器，回收罗德与施瓦茨仪器，回收福禄克仪器，回收泰克仪器，

回收Keysight仪器，回收Agilent仪器，回收R&S仪器，回收Fluke仪器，回收Tektronix仪器，

回收二手网络分析仪，回收二手频谱分析仪，回收二手信号发生器，回收二手手机综测仪，

回收二手进口仪器，回收各种仪器设备，

回收，现金回收，上门回收，整厂回收，闲置仪器回收，倒闭厂回收，型号：E8254A
厂商：Agilent/HP
成色：八成新以上
所有仪器7天之内有任何质量问题均可包退换。


E8254A PSG-A Series Performance Signal Generator, 40 GHz
主要特性与技术指标
• Widest frequency range (250 kHz to 40 GHz) with 0.01 Hz frequency resolution - standard
• Highest power available (+9/+14) at 40 GHz with excellent level accuracy (0.7 and 0.9 dB)
• SSB phase noise less than -110 dBc/Hz at 20 kHz offset at 10 GHz carrier
• Optional SSB phase noise less than -98 dBc/Hz at 1 kHz offset at 10 GHz carrier
• Long warranty 1-year standard and 5-year optional
• Digital Sweep functions (list and step) with capability of calibrating every point at the test port using the user flatness correction
• Easy frequency extension to 110 GHz with Keysight's 83550 Series
• AM, FM, phase, and pulse modulation
• Dual internal modulation generators with sine, square, triangle, positive/negative ramp, Gaussian Noise, Uniform Noise, Swept Sine, Dual Sine up to 1MHz rates
• Internal pulse generator 14 MHz max PRF

描述
The Performance Signal Generator Series offers accurate characterization of products and eliminates the need of an external amplifier for testing high power devices. The PSG Series provides 14 dBm at 40 GHz (option 1EA), reducing overall equipment and test costs. The superior level accuracy of the PSG series (+/- 0.7 dB) reduces test uncertainties and improves production throughput. Standard products have phase noise performance of -85 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 20 kHz offset and a 10 GHz carrier. The PSG provides improved performance with option UNJ of -98 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 10 kHz offset and a 10 GHz carrier. Because the PSG Series guarantees accurate evaluation of devices, errors can be pinpointed early on in the design process thus resulting in a reduced development time.